Reliability Modeling of Single-Sided Aluminized Polyimide Films During Storage Considering Stress-Induced Degradation Mechanism Transition
['Shi-Shun Chen', 'Dong-Hua Niu', 'Wen-Bin Chen', 'Jia-Yun Song', 'Ya-Fei Zhang', 'Xiao-Yang Li', 'Enrico Zio']
/
IEEE Transactions on Reliability
/ Vol. 75
/ No. 1
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